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*Research Progress in Failure Mechanism and Health State Evaluation *
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*A sample of IGBT modules' field failures [23, 34, 40]: a *
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*Study on the Effect of Spoiler Columns on the Heat Dissipation *
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Aluminium corrosion in power semiconductor devices - ScienceDirect
*Study on the Effect of Spoiler Columns on the Heat Dissipation *
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*IGBT module degradation and related failures under thermal *
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High-Voltage Temperature Humidity Bias Test (HV-THB): Overview
*Research Progress in Failure Mechanism and Health State Evaluation *
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Gate Drive Optocoupler Provides Robust Insulation in IGBT
*Cells layout [29]: a) linear gate connection, b) squared mesh gate *
The Role of Service Excellence humidity igbt active area burn and related matters.. Gate Drive Optocoupler Provides Robust Insulation in IGBT. current can be protected by the integrated IGBT DESAT detection and active Miller period of about 2 s to cause repeated high IGBT VCE overshoot and burn the , Cells layout [29]: a) linear gate connection, b) squared mesh gate , Cells layout [29]: a) linear gate connection, b) squared mesh gate
(PDF) Temperature Humidity Bias (THB) Testing on IGBT Modules at
*Humidity Diffusion Process Analysis and Life Prediction of a VSC *
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